The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Nov. 14, 2014
Applicant:

Cavium, Inc., San Jose, CA (US);

Inventors:

Scott E. Meninger, Groton, MA (US);

Jonathan K. Brown, Brookline, MA (US);

Rohan Arora, Marlborough, MA (US);

Assignee:

Cavium, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/20 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/20 (2013.01); G01R 31/025 (2013.01); G01R 31/2601 (2013.01);
Abstract

An apparatus includes a plurality of semiconductor devices and an electrical input device for applying voltage to the plurality of semiconductor devices. There is a switching array configured to sequentially interconnect the electrical input device to each of the semiconductor devices and disconnect the other semiconductor devices from the electrical input device. The semiconductor device connected to the electrical input device is a device under test that produces a test current and the other semiconductor devices are devices not under test that produce, in the aggregate, a leakage current. There is an output node interconnected to the switching array for enabling the measurement of the test current at the output node. There is also a leakage current compensator connected to the output node and the switching array that is configured to divert the leakage current away from the output node.


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