The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Aug. 18, 2014
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Asuka Uchikawa, Nasushiobara, JP;

Shoichi Kanayama, Otawara, JP;

Naru Ikeda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01); G01N 21/51 (2006.01); G01N 21/82 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0098 (2013.01); G01N 21/51 (2013.01); G01N 21/82 (2013.01); G01N 2035/0439 (2013.01); G01N 2035/0453 (2013.01); G01N 2035/0455 (2013.01);
Abstract

According to one embodiment, an automatic analyzer includes a magnet and a photometric mechanism. The magnet generates a magnetic field applied to a test solution containing a sample and magnetic particles accommodated in a cuvette. The photometric mechanism includes a light source and a detector. The light source irradiates light toward the test solution. The detector is provided in a position opposed to the light source across the cuvette to detect the light from the test solution. The magnet has a geometrical arrangement such that a magnetic flux density of the magnetic field in the test solution inside the cuvette becomes substantially uniform.


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