The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Jun. 26, 2012
Raj Rajagopal, Woodbury, MN (US);
Kurt J. Halverson, Lake Elmo, MN (US);
Ramasubramani Kuduva Raman Thanumoorthy, Woodbury, MN (US);
Raj Rajagopal, Woodbury, MN (US);
Kurt J. Halverson, Lake Elmo, MN (US);
Ramasubramani Kuduva Raman Thanumoorthy, Woodbury, MN (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
Systems and methods for detecting an analyte of interest in a sample. The system can include a first container comprising a filter portion. The filter portion can include a filter comprising a filtrand of the sample on a first side of the filter. The system can further include a second container comprising the filter portion coupled to a detection portion comprising a microstructured surface. The method can include providing the first container, coupling the filter portion to the detection portion to form the second container where the first side of the filter faces the microstructured surface, and centrifuging the second container toward the microstructured surface. The method can further include inverting the second container after centrifuging to decant the supernatant from the detection portion, such that a concentrate comprising a sediment of the sample is retained in the microstructured surface, which can be interrogated for an analyte of interest.