The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2016

Filed:

Jan. 28, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Harsh Chaudhary, Briarcliff Manor, NY (US);

Younghun Kim, White Plains, NY (US);

Tarun Kumar, Mohegan Lake, NY (US);

Abhishek Raman, Santa Clara, CA (US);

Rui Zhang, Ossining, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/00 (2006.01); G01M 3/28 (2006.01); G01M 3/00 (2006.01);
U.S. Cl.
CPC ...
G01M 3/2807 (2013.01); G01M 3/007 (2013.01);
Abstract

A method and system to localize a leak in a pipeline network include identifying a respective measured time at which an effect of a leak exhibits in a time-varying data signal measured by each of a plurality of sensors distributed along the pipeline network, each pair of the plurality of sensors defining a respective pipe segment therebetween. Estimating a time of occurrence of the leak based on the measured time associated with two or more of the plurality of sensors; and estimating a relative distance of a leak location from one or more of the plurality of sensors. Determining the leak location is based on the relative distance.


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