The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9470581 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 18, 2016

Filed:

Feb. 25, 2014
Applicant:

Ap Systems Inc., Hwaseong-Si, Gyeonggi-Do, KR;

Inventor:

Sang Hyun Ji, Yongin-Si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F27D 11/00 (2006.01); G01J 5/60 (2006.01); G01J 5/00 (2006.01); G01J 5/06 (2006.01);
U.S. Cl.
CPC ...
G01J 5/602 (2013.01); G01J 5/0007 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/067 (2013.01);
Abstract

Disclosed are an apparatus and method of detecting a temperature through a pyrometer in a non-contact manner, and an apparatus for processing a substrate using the apparatus, and more particularly, an apparatus and method of detecting a temperature, which precisely measures a temperature without any effect by humidity, and an apparatus for processing a substrate using the same. In an exemplary embodiment, an apparatus for detecting a temperature includes a humidity sensor configured to measure a humidity value, a temperature compensation database configured to store a temperature compensation value for each humidity value, and a pyrometer providing a non-contact temperature calculated by adding a temperature compensation value corresponding to a humidity value detected by the humidity sensor to a temperature to be compensated, which is obtained by converting a measured a wavelength intensity of a radiation radiated from an object in a wavelength band to be compensated.


Find Patent Forward Citations

Ji, Sang. (2016). Apparatus and method of detecting temperature and apparatus for processing substrate (U.S. Patent No. 9470581). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9470581

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