The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 18, 2016
Filed:
Mar. 29, 2016
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Masashi Ueshima, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/21 (2006.01); B41J 2/165 (2006.01); B41J 2/045 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/0451 (2013.01); B41J 2/04558 (2013.01); B41J 2/16579 (2013.01); B41J 2/2139 (2013.01); B41J 2/2142 (2013.01);
Abstract
A liquid is ejected which has a volume exceeding a volume for forming a dot of a maximum size used in regular liquid ejection to output a high load pattern, an ejection abnormality detection pattern is output for detecting an ejection element abnormality within a specific period of time from outputting the high load pattern, read data of the output ejection abnormality detection pattern is acquired, and the acquired read data is analyzed to detect an abnormal ejection element.