The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Sep. 22, 2015
Applicants:

Jason D. Mckinney, Bowie, MD (US);

Sharon R. Harmon, Herndon, VA (US);

Inventors:

Jason D. McKinney, Bowie, MD (US);

Sharon R. Harmon, Herndon, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/079 (2013.01); H04B 10/11 (2013.01);
U.S. Cl.
CPC ...
H04B 10/079 (2013.01); H04B 10/11 (2013.01);
Abstract

A system for measuring an RF input signal frequency includes a sampling optical pulse train with a frequency-dithered repetition-rate, and a sub-sampled analog link coupled to the optical pulse train whereby the RF input signal frequency is determined. This frequency dither imparts well-characterized modulation sidebands onto the input RF signal to be measured. By measuring the amplitude of these sidebands relative to the incoming aliased signal amplitude the frequency of the original signal is readily determined. The use of optical sampling dramatically increases the bandwidth over which the disambiguation technique is applied, and coarse disambiguation is achieved in a single acquisition.


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