The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Aug. 26, 2015
Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;
Kazuhiko Takaishi, Machida Tokyo, JP;
Shinsuke Akiya, Yokohama Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, a contact-detecting method includes calculating a representative value for each of a plurality of first zones. The plurality of first zones is provided at different radial locations on the disk. The representative value is calculated based on values measured at a plurality of different radial locations included in each of the first zones. The method includes detecting a contact point at which a first member contacts with a second member based on a first difference. The first difference is a difference between a value measured at an objective measuring point and a representative value of a second zone among the plurality of first zones. The objective measuring point is included in a third zone among the plurality of first zones. The second zone is arranged radially inward of the third zone.