The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Dec. 11, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Takashi Kobayashi, Matsumoto, JP;
Makoto Fujino, Shiojiri, JP;
Yoshio Okumura, Matsumoto, JP;
Bunei Kyuu, Shiojiri, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 7/00 (2013.01); G06T 7/408 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30168 (2013.01);
Abstract
An image evaluation device includes an image acquisition section that acquires an input image to be evaluated, a noise image generation section that generates a noise image that emphasizes noise included in the input image and having a particular spatial frequency that correlates with human perception, a statistic value acquisition section that acquires a predetermined type statistic value from the noise image, and a noise amount specification section that specifies an amount of noise in the input image on the basis of the statistic value.