The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Jun. 07, 2013
Applicant:

Hewlett-packard Development Company, L.p., Houston, TX (US);

Inventors:

Martin Arlitt, Calgary, CA;

Manish Marwah, Palo Alto, CA (US);

Amip J. Shah, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 21/00 (2006.01); G06Q 50/06 (2012.01); G06Q 10/00 (2012.01); G01D 4/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 50/06 (2013.01); G06Q 10/20 (2013.01); G01D 4/002 (2013.01); Y02B 90/241 (2013.01); Y04S 20/32 (2013.01);
Abstract

Examples of meter data management testing are disclosed. In one example implementation according to aspects of the present disclosure, a computing device may include one or more processors, a memory for storing machine readable instructions, and a data store. The computing device may further include a meter data management testing module stored in the memory and executing on at least one of the one or more processors to test a meter data management system using a data set of representative metering data and a user-generated test scenario specifying a plurality of metering parameters.


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