The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Dec. 04, 2012
Applicant:

Panasonic Intellectual Property Corporation of America, Torrance, CA (US);

Inventors:

Sotaro Tsukizawa, Osaka, JP;

Hiroyuki Kubotani, Hyogo, JP;

ZhiHeng Niu, Singapore, SG;

Sugiri Pranata, Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00315 (2013.01); G06K 9/00248 (2013.01); G06K 9/00281 (2013.01); G06K 9/00335 (2013.01);
Abstract

A measurement-target-selecting device that is capable of estimating a face shape with high precision and at low computational time. In this device, a face texture assessment value calculating part () calculates a face texture assessment value representing a degree of match between an input face image and the texture of a face shape candidate, a facial-expression-change-likelihood-calculating part () calculates a first likelihood between a face shape constituting a reference and a face shape candidate, a correlation assessment part (); calculates a first correlation assessment value representing the strength of a correlation between the face texture assessment value and the first likelihood, and a selection part () selects from among the plurality of face shape candidates as a measurement target a face shape candidate having a first correlation assessment value that is lower than a first threshold.


Find Patent Forward Citations

Loading…