The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Oct. 11, 2011
Sateesha Nadabar, Framingham, MA (US);
Venkat K. Gopalakrishnan, Arlington, MA (US);
Carl W. Gerst, Iii, Clifton Park, NY (US);
Sateesha Nadabar, Framingham, MA (US);
Venkat K. Gopalakrishnan, Arlington, MA (US);
Carl W. Gerst, III, Clifton Park, NY (US);
COGNEX CORPORATION, Natick, MA (US);
Abstract
A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station using a stationary camera that has a field of view that is centered along a trajectory that forms an obtuse angle with at least a portion of the first surface and that includes at least a portion of the first surface, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.