The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Oct. 21, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Sebastian Nelke, Schoenaich, DE;
Martin Oberhofer, Bondorf, DE;
Yannick Saillet, Stuttgart, DE;
Jens Seifert, Gaertringen, DE;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06F 17/30303 (2013.01); G06F 17/30563 (2013.01); G06Q 10/10 (2013.01);
Abstract
A computer implemented method, computer program product and system for data quality monitoring includes measuring a data quality of loaded data relative to a predefined data quality metric. The measuring the data quality includes identifying delta changes in at least one of the loaded data and the data quality rules relative to a previous measurement of the data quality of the loaded data. Logical calculus defined in the data quality rules is applied to the identified delta changes.