The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Oct. 07, 2015
Océ-technologies B.v., Venlo, NL;
Daisuke Kawaguchi, Venlo, NL;
Catharinus Van Acquoij, Venlo, NL;
Ernest J. J. Clevers, Venlo, NL;
Petrus L. J. Oteman, Venlo, NL;
OCE-TECHNOLOGIES B.V., Venlo, NL;
Abstract
The present invention provides an apparatus () for defect detection in a printing system (). The apparatus () comprises: a sensing unit () having at least one first sensor device () for sensing a surface geometry or topology of a sheet (S) to be printed as the sheet (S) travels on a transport path (P) of the printing system () and for generating data (I) representative of that surface geometry or topology; and a processor device () for processing the data (I) from the first sensor device () to detect and classify deformations (D) in the surface geometry or topology of the sheet (S) based on at least one predetermined criterion, wherein the at least one predetermined criterion is adjustable or variable to suit operating conditions in the printing system (). Further, the invention provides a corresponding method of detecting defects in a printing system ().