The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Sep. 17, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Malcolm S. Allen-Ware, Austin, TX (US);

Alan J. Drake, Round Rock, TX (US);

Michael S. Floyd, Cedar Park, TX (US);

Tilman Gloekler, Gaertringen, DE;

Charles R. Lefurgy, Austin, TX (US);

Karthick Rajamani, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G06F 11/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G05B 13/024 (2013.01); G06F 11/008 (2013.01);
Abstract

A mechanism is provided for implementing an operational parameter change within the data processing system based on an identified degradation. One or more degradations existing in the data processing system are identified based on a set of degradation values obtained from a set of degradation sensors. A determination is made as to whether one or more operational parameters need to be modified based on the one or more identified degradations. Responsive to determining that the one or more operational parameters need to be modified based on the one or more identified degradations, an input change is implemented to a one or more control devices in order that the one or more operational parameters are modified.


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