The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jun. 17, 2015
Sony Corporation, Tokyo, JP;
Norihiro Tanabe, Tokyo, JP;
Takashi Yamamoto, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
A microscope includes a first imaging optical system that images sample transmitted light transmitted through a sample provided on a stage, and a second imaging optical system that images a part of the sample transmitted light branched from the first imaging optical system. Here, the second imaging optical system includes a light beam branching element that branches the part of the sample transmitted light from the first imaging optical system, and has a thickness of a predetermined threshold or more, an imaging element that images a phase difference image of the branched sample transmitted light, one or a plurality of optical elements that images an image of the phase difference image of the branched sample transmitted light on the imaging element, and a filter that shields a part of the branched sample transmitted light imaged on the imaging element.