The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Oct. 24, 2012
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B 37/02 (2006.01); G01B 11/14 (2006.01); G01V 8/10 (2006.01); H05B 33/08 (2006.01);
U.S. Cl.
CPC ...
G01V 8/10 (2013.01); H05B 33/0851 (2013.01); H05B 33/0854 (2013.01); H05B 37/0227 (2013.01); Y02B 20/44 (2013.01);
Abstract

The invention relates to a method for determining presence of objects in an area () surrounding a luminaire (). The luminaire () includes a first light source (), a second light source (), and a sensor (). The first light source () is configured to emit a first light beam () adapted to illuminate a first predefined area. The second light source () is configured to emit a second light beam () adapted to illuminate a background area surrounding the first predefined area. The sensor () is configured to detect a back-reflected first light beam () and a back-reflected second light beam (). The method includes determining whether objects are present in the area surrounding the luminaire based on a comparison of information indicative of a signal strength of the detected back-reflected first light beam () and information indicative of a signal strength of the detected back-reflected second light beam ().


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