The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Oct. 08, 2014
Applicant:

Schlumberger Technology Corporation, Sugar land, TX (US);

Inventors:

Barbara Anderson, Brookfield Center, CT (US);

Thomas D. Barber, Houston, TX (US);

Emmanuel Legendre, Sevres, FR;

Martin G. Luling, Paris, FR;

Pabitra Sen, Chapel Hill, NC (US);

Reza Taherian, Al-Khobar, SA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/18 (2006.01); E21B 47/00 (2012.01); G01N 27/00 (2006.01); G01N 33/24 (2006.01); G01V 3/30 (2006.01); G01V 3/38 (2006.01);
U.S. Cl.
CPC ...
G01V 3/18 (2013.01); E21B 47/00 (2013.01); G01N 27/00 (2013.01); G01N 33/24 (2013.01); G01V 3/30 (2013.01); G01V 3/38 (2013.01);
Abstract

Techniques involve determining the frequency-dependent dielectric permittivity spectrum of a rock sample. Determining the frequency-dependent dielectric permittivity may involve defining a series of electromagnetic measurement data having at least a measurement at a frequency from which a substantially frequency-independent value of dielectric permittivity ∈can be obtained. The electromagnetic measurement data also includes measurements at different frequencies from which values for frequency-dependent dielectric permittivity ∈(f) can be obtained. Using these measurements, the frequency-dependent spectrum of the sample may be determined.


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