The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Apr. 05, 2005
Kutay F. Ustuner, Mountain View, CA (US);
Lewis J. Thomas, Palo Alto, CA (US);
D-l Donald Liu, Issaquah, WA (US);
Kutay F. Ustuner, Mountain View, CA (US);
Lewis J. Thomas, Palo Alto, CA (US);
D-L Donald Liu, Issaquah, WA (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Aberration estimation uses cross correlation of receive-focused transmit element data. A set of sequentially fired broad transmit beams insonify an object from different steering angles. Each transmit beam emanates from an actual or a virtual transmit element. For every firing, a receive beamformer forms a transmit element image of the insonified region by focusing the received signals. An estimator estimates aberration by cross correlating or comparing the transmit element images. Where a virtual transmit element is used, the virtual transmit element images are back propagated to an actual transmit element position before aberration estimation. The estimations are used to form corrected transmit element images which are then summed pre-detection to form a high-resolution synthetic transmit aperture. Alternatively, the estimations are used to improve conventional focused-transmit imaging.