The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Sep. 28, 2015
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Dong Uk Lee, Icheon-si, KR;
Young Ju Kim, Icheon-si, KR;
Assignee:
SK HYNIX INC., Icheon-Si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01); G01R 31/3185 (2006.01); G01R 31/04 (2006.01); H01L 23/48 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
G01R 19/0092 (2013.01); G01R 31/04 (2013.01); G01R 31/318513 (2013.01); H01L 23/481 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06541 (2013.01); H01L 2225/06596 (2013.01); H01L 2924/0002 (2013.01);
Abstract
A test circuit includes a through via test unit configured to be set to a first resistance value in response to a first test control signal and to a second resistance value in response to the first test control signal and a second test control signal, and form a current path including a through via that electrically connects a first chip and a second chip; and a test measurement unit configured to supply a test voltage to the through via and measure a current flowing through the through via.