The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Mar. 24, 2015
Applicant:
Inotera Memories, Inc., Taoyuan, TW;
Inventor:
Wei-Chih Wang, New Taipei, TW;
Assignee:
INOTERA MEMORIES, INC., Taoyuan, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/16 (2010.01); G01Q 70/14 (2010.01); B22C 9/22 (2006.01); B22D 19/00 (2006.01); B22D 21/02 (2006.01); B22D 25/02 (2006.01); B23K 31/02 (2006.01); G01Q 70/08 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/16 (2013.01); B22C 9/22 (2013.01); B22D 19/00 (2013.01); B22D 21/022 (2013.01); B22D 25/02 (2013.01); B23K 26/21 (2015.10); B23K 31/02 (2013.01); G01Q 70/08 (2013.01); G01Q 70/14 (2013.01);
Abstract
The present invention provides a novel method of manufacturing the probe unit and a tip assemble and disassemble procedure for test tools, which includes a body with a joint portion and a base portion and a probe tip extending from one side of the base portion opposite to the joint portion, where the probe tip and the base portion are integrally made of same material different from the material of the joint portion.