The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Feb. 21, 2014
Pepperl + Fuchs Gmbh, Mannheim, DE;
Enrico Schulz, Mannheim, DE;
PEPPERL + FUCHS GmbH, Mannheim, DE;
Abstract
A method and device for metrologically differentiating material regions, namely majority regions and minority regions of a page-like, web-like or sheet-like material. At least one sensor receives a measuring signal of variable amplitude, the amplitude being variable depending on the material region located in a spatial detection range of the sensor. The amplitude is increased by a controllable amplifier. The material is moved relatively to the sensor such that majority regions are located in the spatial detection range of the sensor more frequently than minority regions. The method is characterized in that in phases, in which majority regions undergo examination by means of the sensor, by means of the amplifier regulation of the amplitude to a set point is carried out and the sensor generates a signal 'majority region', and that in situations, in which the amplitude undergoes a sufficient change, the sensor generates a signal 'minority region'.