The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Jun. 13, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Daniel Scott Groninger, Port Royal, PA (US);

Soundarrajan Kaliaperumal, Karnataka, IN;

Galen Lee Swyers, Yeagertown, PA (US);

David George Perrett, Flintshire, GB;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01); G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9086 (2013.01); G01B 7/105 (2013.01); G01N 27/9046 (2013.01);
Abstract

A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.


Find Patent Forward Citations

Loading…