The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Dec. 28, 2012
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Shuwei Li, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Ziran Zhao, Beijing, CN;
Yinong Liu, Beijing, CN;
Qingjun Zhang, Beijing, CN;
Weibin Zhu, Beijing, CN;
Yi Wang, Beijing, CN;
Shuqing Zhao, Beijing, CN;
Wenjian Zhang, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Abstract
Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.