The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jul. 29, 2014
Clemson University, Clemson, SC (US);
Pingshan Wang, Central, SC (US);
Yan Cui, Central, SC (US);
Yuxi He, Evanston, IL (US);
David Moline, Pendleton, SC (US);
Jiwei Sun, Central, SC (US);
Clemson University, Clemson, SC (US);
Abstract
Highly sensitive and tunable RF sensors that provide detection and analysis of single cells and particles are provided. The tunable RF sensors are configured as tunable interferometers, wherein cells or particles to be analyzed are passed through a channel, such as a microfluidic channel, across waveguides corresponding to reference and test branches of the interferometers. A network analyzer coupled to the interferometers can be configured to measure a plurality of scattering parameters, such as transmission scattering coefficients (S) of the reference and test branches, to evaluate characteristics of cells passing through the channel. A plurality of tunable interferometers may be employed, each interferometer operating in different frequency bands such that information obtain from the plurality of interferometers may be combined to provide further information.