The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Oct. 18, 2013
Applicant:

Korea Institute of Science and Technology, Seoul, KR;

Inventors:

Jin Seok Kim, Seoul, KR;

Jun-Kyo Francis Suh, Seoul, KR;

Hyowon Moon, Gwacheon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/12 (2006.01); G01N 21/45 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01K 11/125 (2013.01); G01N 21/45 (2013.01); G01N 21/47 (2013.01);
Abstract

A probe sensor has a probe structure having a probe body inserted into an experiment subject, a block body disposed on the probe body to transmit or reflect an incident light, and a light irradiation body for inputting a first incident light to the block body; a first light source for generating the first incident light and transmitting to the light irradiation body; and a light analyzer for analyzing a first reflection light which is a reflection light of the first incident light reflected by the block body, wherein the length of the block body changes according to a temperature change, and wherein the light analyzer measures a temperature change of the experiment subject by detecting a wavelength change of the first reflection light according to the length change of the block body.


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