The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

May. 15, 2012
Applicant:

Yves Becheret, Boulogne-Billancourt, FR;

Inventor:

Yves Becheret, Boulogne-Billancourt, FR;

Assignee:

SAGEM DEFENSE SECURITE, Boulogne-Billancourt, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01P 15/18 (2013.01); G01C 25/00 (2006.01);
U.S. Cl.
CPC ...
G01C 25/00 (2013.01); G01C 25/005 (2013.01); G01P 21/00 (2013.01);
Abstract

A method of calibrating an inertial unit is provided. During a first static stage, in which the inertial unit is in a first orientation, measurements are taken by means of the accelerometers and the inertial rotation sensors. During a dynamic stage, the orientation of the inertial unit is changed, at least in part in azimuth, from the first orientation towards a second orientation, while taking measurements by means of the inertial rotation sensors. During a second static stage, in which the inertial unit is in the second position, measurements are taken by means of the accelerometers and of the inertial rotation sensors. For each static stage, a direction, an amplitude, and a mean speed of rotation for apparent gravity in an inertial frame of reference is estimated, variation is calculated in orientation between the static stages, and the accelerometer biases is deduced therefrom.


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