The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Sep. 16, 2011
Arisa Yanagihara, Tokyo, JP;
Minoru Tagami, Tokyo, JP;
Kenichiro Watanabe, Tokyo, JP;
Yoshinori Ishida, Tokyo, JP;
Arisa Yanagihara, Tokyo, JP;
Minoru Tagami, Tokyo, JP;
Kenichiro Watanabe, Tokyo, JP;
Yoshinori Ishida, Tokyo, JP;
IHI CORPORATION, Tokyo, JP;
Abstract
A method comprises a calibration curve creation step in which a calibration curve is created on the basis of hardened surface layer depth. A destructive test is performed on one of two samples in pairs, and propagation time of a first peak of a first wave of waveform of a signal outputted with the other in pairs in a non-destructive test is determined, the samples in pairs being prepared such that carburization depth varies gradually from pair to pair. A waveform of a signal outputted with a to-be-inspected piece is obtained. The propagation time of a first peak of a first wave of the waveform of the signal output with the to-be-inspected piece is obtained, and the hardened surface layer depth of the to-be-inspected piece is obtained using the calibration curve, on the basis of the propagation time obtained with the to-be-inspected sample.