The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Apr. 26, 2007
Applicants:
Stanley H. Sakai, Cupertino, CA (US);
William Mcmillan, Cupertino, CA (US);
Inventors:
Stanley H. Sakai, Cupertino, CA (US);
William McMillan, Cupertino, CA (US);
Assignee:
CEPHEID, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12Q 1/70 (2006.01); G06F 19/18 (2011.01); G06F 19/20 (2011.01); G06F 19/12 (2011.01);
U.S. Cl.
CPC ...
C12Q 1/6813 (2013.01); G06F 19/12 (2013.01); G06F 19/18 (2013.01); G06F 19/20 (2013.01); Y10T 436/143333 (2015.01);
Abstract
The present invention provides methods, apparatuses and computer programs for verifying the integrity of a probe by comparing the fluorescence value of a probe to a threshold value. The invention also provides for methods, apparatuses and computer programs for normalizing the fluorescence value of a probe and detecting a target nucleic acid in a sample.
Sakai, Stanley. (2016). Methods, apparatus, and computer programs for verifying the integrity of a probe (U.S. Patent No. 9464317). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9464317
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile