The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Aug. 15, 2014
Applicant:

Electro Scientific Industries, Inc., Portland, OR (US);

Inventors:

Robert Reichenbach, Portland, OR (US);

Chuan Yang, Portland, OR (US);

Fang Shan, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 (2006.01); B23K 26/00 (2014.01); B23K 26/08 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0624 (2015.10); B23K 26/0006 (2013.01); B23K 26/0063 (2013.01); B23K 26/082 (2015.10); B23K 26/083 (2013.01); B23K 26/0869 (2013.01); B23K 2201/34 (2013.01); B23K 2201/40 (2013.01); B23K 2203/08 (2013.01); B23K 2203/10 (2013.01); B23K 2203/14 (2013.01); B23K 2203/56 (2015.10); Y10T 428/24802 (2015.01);
Abstract

Laser output () is employed to mark an article () including a layer () supported by a substrate (), wherein the layer () has a thickness (t) that is less than or equal to 50 microns. The laser output () is focused to a numerical aperture diffraction-limited spot size () of less than or equal to 5 microns at a focal point () of the beam waist () and directed into the layer () to form a plurality of structures comprising a plurality of laser-induced cracks within the layer () and within a region of the article (), wherein the laser-induced cracks terminate within the layer () without extending to the substrate () or an outer surface () of the layer (), and wherein the plurality of structures are configured to scatter light incident upon the article ().


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