The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jun. 26, 2014
Applicant:
Sandvik Intellectual Property Ab, Sandviken, SE;
Inventors:
Åke Östlund, Hagersten, SE;
Jonny Edman, Ronninge, SE;
Erik Lindahl, Uppsala, SE;
Jan Engqvist, Uppsala, SE;
Assignee:
SANDVIK INTELLECTUAL PROPERTY AB, Sandviken, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/08 (2006.01); B23B 27/14 (2006.01); C23C 16/02 (2006.01); C23C 16/36 (2006.01); C23C 16/40 (2006.01); C23C 16/56 (2006.01); C23C 30/00 (2006.01);
U.S. Cl.
CPC ...
B23B 27/148 (2013.01); C23C 16/0254 (2013.01); C23C 16/0272 (2013.01); C23C 16/36 (2013.01); C23C 16/403 (2013.01); C23C 16/56 (2013.01); C23C 30/005 (2013.01); B23B 2200/00 (2013.01); B23B 2224/04 (2013.01); B23B 2224/32 (2013.01); Y10T 407/27 (2015.01);
Abstract
A coated cutting tool comprising substrate and a coating, wherein the coating comprises a layer of MTCVD TiCN, and a layer of α-AlO, wherein the α-AlOlayer exhibits an X-ray diffraction pattern, as measured using CuKα radiation, the (hkl) reflections used are (012), (104), (110), (113), (116), (300), (214) and (0 0 12), and the TC(0 0 12) is higher than 5 and a full width half maximum (FWHM) of a rocking curve peak of the (0 0 12) plane of the α-AlOis lower than 30°.