The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Apr. 02, 2012
Takayoshi Suzuki, Shizuoka, JP;
Haruo Ishikawa, Tokyo, JP;
Takayoshi Suzuki, Shizuoka, JP;
Haruo Ishikawa, Tokyo, JP;
KOWA COMPANY, LTD., Aichi, JP;
Abstract
Provided is a technique which, in the design of intraocular lenses, simplifies design work and makes it possible for aberration of the entire eyeball to more precisely match a target value when the designed intraocular lens is inserted into a patient's eye. This intraocular lens design method involves deriving an intraocular lens aberration target value from the aberration of the cornea and anterior chamber and a set value of the total eyeball aberration (S), and determining an intraocular lens shape such that the at least the aberration of the intraocular lens coincides with the target value (S-S). The intraocular lens aberration is set to an intraocular lens aberration for which prescribed convergent light is incident to the intraocular lens (S).