The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Apr. 27, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Toshinobu Tokita, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 5/0091 (2013.01); A61B 5/0095 (2013.01); A61B 8/0825 (2013.01); A61B 8/403 (2013.01); A61B 8/5223 (2013.01);
Abstract

A subject information acquisition apparatus includes a first holding member that holds a subject, a probe that receives an elastic wave from the subject through the first holding member, a first holding member deformation amount measuring unit that measures an amount of deformation of the first holding member, and a processing unit that creates an area for generating subject information by using the amount of deformation of the first holding member and position information of the first holding member deformation amount measuring unit and generates an information value of subject information corresponding to the area for generating subject information by using a signal outputted by the probe.


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