The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Jan. 28, 2013
Björn Popilka, Hemsbach, DE;
Volker Wedler, Hirschberg, DE;
Anders Adamson, Darmstadt, DE;
Frank Thiel, Ober-Ramstadt, DE;
Björn Popilka, Hemsbach, DE;
Volker Wedler, Hirschberg, DE;
Anders Adamson, Darmstadt, DE;
Frank Thiel, Ober-Ramstadt, DE;
Sirona Dental Systems GmbH, Bensheim, DE;
Abstract
The invention relates to a reference object () and a method for checking a measuring system (), wherein a plurality of three-dimensional recordings () of a reference object are recorded from different recording directions () by means of the measuring system (). The reference object () has a closed shape, wherein each of the three-dimensional recordings () is registered with at least the preceding recording (). In the case of a faulty calibration and/or in the case of a faulty registration, the individual recordings () are deformed compared to the actual shape of the reference object (), so that the deformation continues when assembling the individual three-dimensional recordings () to form an overall recording () and the generated overall recording () deviates in its dimensions from the dimensions of the reference object () as a result thereof. At least one object region () of the reference object () is measured twice, at the beginning of a circuit and at the end of the circuit, wherein a distance () is determined in the overall recording () between a first position of the object region () in a first recording at the beginning of the circuit and a second position of the object region () in a second recording at the end of the circuit.