The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Apr. 17, 2014
Applicant:
Photono Oy, Helsinki, FI;
Inventor:
Antti Kontiola, Helsinki, FI;
Assignee:
PHOTONO OY, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/16 (2006.01); A61B 5/00 (2006.01); A61B 3/107 (2006.01);
U.S. Cl.
CPC ...
A61B 3/165 (2013.01); A61B 3/102 (2013.01); A61B 3/1005 (2013.01); A61B 3/107 (2013.01); A61B 5/0066 (2013.01); A61B 5/0095 (2013.01);
Abstract
A method is disclosed for measuring pressure under a flexible cover by utilizing electromagnetic waves. Laser radiation is directed to the cover from a distance to generate vibration or a mechanical wave at the cover at at least one generation location of the cover on the basis of photoacoustic phenomena. Based on the electromagnetic waves, cover vibrations are detected due to the mechanical wave, and recorded to detect the mechanical wave at at least one recording location and to form mechanical wave information. Pressure information of pressure under the flexible cover is detected based on at least one recorded signal.