The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 11, 2016

Filed:

Jan. 31, 2014
Applicant:

Nidek Co., Ltd., Gamagori-shi, Aichi, JP;

Inventor:

Kenji Nakamura, Toyohashi, JP;

Assignee:

NIDEK CO., LTD., Gamagori-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/032 (2006.01); A61B 3/103 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/032 (2013.01); A61B 3/0008 (2013.01); A61B 3/103 (2013.01);
Abstract

An optometric apparatus includes an optotype presenting optical system for presenting part of a plurality of optotypes corresponding to visual acuity to be measured to an examinee's eye and a visible light source for irradiating illumination light to the optotypes presented to the eye through the optotype presenting optical system. A controller is configured to execute processing of changing a light amount of the illumination light to be irradiated to the optotypes from the visible light source between a predetermined first light amount and a second light amount lower than the first light amount and processing of switching the optotypes to be presented to the eye at the time of changing the light amount of the illumination light from the first light amount to the second light amount.


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