The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2016
Filed:
Apr. 04, 2013
Visionix Ltd., Jerusalem, IL;
Marc Abitbol, Jerusalem, IL;
Ran Yam, Jerusalem, IL;
Haggai Herman, Givat Shmuel, IL;
Ian Melnick, Jerusalem, IL;
VISIONIX LTD., Jerusalem, IL;
Abstract
Systems for performing combined phoropter and refractive measurements to ascertain the aberrations present in the eye of a subject. The systems use a pair of phoropter wheel assemblies, one for each eye, each assembly comprising a number of lens wheels incorporating the series of lenses and wedges required to compensate for a range of refractive vision aberrations. The vision of each eye is corrected by a combination of a subjective phoropter measurement, iteratively performed with an objective wavefront analysis measurement to determine the residual aberrations existing after the initial phoropter correction. The system is able to automatically align the axes of each wavefront analyzer with is corresponding eye, by means of centering the pupil image in the wavefront analyzer camera, and to determine the pupil distance. By changing the focusing point on the wavefront analyzer of the light reflected from the eye, the corneal profile can be measured.