The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
May. 29, 2013
Oce Printing Systems Gmbh & Co. KG, Poing, DE;
Andreas Paul, Vaterstetten, DE;
Océ Printing Systems GmbH & CO. KG, Poing, DE;
Abstract
In a method to control a color printer or color copier, a color separation of a first color and a color separation of a second color are applied to a printing substrate to generate a print image. Also, with aid of a printing unit, at least a first control field is printed on the printing substrate. The first control field has a predetermined pattern that includes at least the first color and the second color and is designed such that a color value of the first control field changes depending on a registration error between the first and the second color separations. A reference field is also printed on the printing substrate, a pattern of the reference field being predetermined such that it has a same color value independent of the registration error. The color value of the first control field is measured with a color value sensor. The color value of the reference field is also measured with the color value sensor and a desired color value is determined depending on the color value of the reference field. A deviation between the measured color value of the first control field and the desired color value is determined, the deviation corresponding to a spatial shift of the color separations. At least one control signal is generated to reduce the spatial shift depending on the determined deviation.