The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Apr. 26, 2013
Applicant:

Sony Corporation, Tokyo, JP;

Inventor:

Junya Shiraishi, Nagano, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H03M 13/45 (2006.01); H03M 13/00 (2006.01); G11B 20/10 (2006.01); G11B 20/18 (2006.01); H03M 13/41 (2006.01);
U.S. Cl.
CPC ...
H03M 13/456 (2013.01); G11B 20/10268 (2013.01); G11B 20/10277 (2013.01); G11B 20/10305 (2013.01); G11B 20/10361 (2013.01); G11B 20/10379 (2013.01); G11B 20/1833 (2013.01); H03M 13/6343 (2013.01); H03M 13/41 (2013.01);
Abstract

Provided is a signal quality evaluation apparatus, including an error pattern detection unit to which binarized data obtained by performing a PRML decoding process on a reproduced signal of bit information by partial response equalization and maximum likelihood decoding is input, the error pattern detection unit configured to detect at least one specific error pattern that is a bit pattern that is longer than a constraint length of the PRML decoding process, a metric difference calculation unit configured to calculate a metric difference of the at least one specific error pattern that has been detected by the error pattern detection unit, and an index value generation unit configured to generate an index value of a reproduced signal quality by using a distribution of the metric difference obtained by the metric difference calculation unit.


Find Patent Forward Citations

Shiraishi, Junya. (2016). Signal quality evaluation apparatus, signal quality evaluation method, and reproducing device (U.S. Patent No. 9461672). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9461672

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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