The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Feb. 05, 2015
Altera Corporation, San Jose, CA (US);
Kyung Suk Oh, Cupertino, CA (US);
Sean Shau-Tu Lu, San Jose, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
A method of measuring duty-cycle distortion in a signal (e.g., flowing between an operating circuit and a memory circuit), where the signal has a known period, the signal being measured is in a first state during a first portion of the period, and is in a different state during a second portion of the period, includes advancing or retarding the signal until an edge of the signal intersects an edge of the other signal. From the amount of the advancing or retarding, the duty cycle and the magnitude of duty-cycle distortion are determined. This may be used to control correction of the duty-cycle distortion. An interpolator circuit may be used to advance or retard the signal. A processor may be used to keep track of the amount of advancing or retarding, to determine the duration of the duty cycle, and control correction of the duty-cycle distortion.