The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Jan. 14, 2016
Applicant:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Inventors:

Yeong-Chang Chou, Irvine, CA (US);

Sujane C. Wang, Rolling Hills Estates, CA (US);

Hsu-Hwei Chen, Redondo Beach, CA (US);

Assignee:

Northrop Grumman Systems Corporation, Falls Church, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/335 (2006.01); H01L 21/338 (2006.01); H01L 21/336 (2006.01); H01L 29/778 (2006.01); H01L 29/205 (2006.01); H01L 29/66 (2006.01); H01L 21/306 (2006.01); H01L 21/308 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7784 (2013.01); H01L 21/02057 (2013.01); H01L 21/308 (2013.01); H01L 21/30608 (2013.01); H01L 29/205 (2013.01); H01L 29/66462 (2013.01);
Abstract

A field effect transistor (FET) device including a GaAs substrate, an AlGaAs buffer layer provided on the substrate, an InGaAs channel layer provided on the buffer layer, an AlGaAs barrier layer provided on the channel layer, a GaAs undoped etch stop layer provided on the barrier layer where the undoped layer defines a depth of a gate recess in the FET device, and a heavily doped GaAs cap layer provided on the etch stop layer. The cap layer has a predetermined thickness and the thickness of the combination of the barrier layer and the undoped layer has the predetermined thickness, where the thickness of the undoped layer and the thickness of the barrier layer are selectively provided relative to each other so as to define the depth of the gate recess.


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