The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Dec. 11, 2014
General Electric Company, Schenectady, NY (US);
Jean-Baptiste Thibault, Waukesha, WI (US);
Debashish Pal, Waukesha, WI (US);
Jie Tang, Waukesha, WI (US);
Ken David Sauer, South Bend, IN (US);
Charles Bouman, Lafayette, IN (US);
Ruoqiao Zhang, Lafayette, IN (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
UNIVERSITY OF NOTRE DAME DU LAC, Notre Dame, IN (US);
PURDUE RESEARCH FOUNDATION, Lafayette, IN (US);
Abstract
A method includes obtaining spectral computed tomography (CT) information via an acquisition unit having an X-ray source and a CT detector. The method also includes, generating, with one or more processing units, using at least one image transform, a first basis image and a second basis image using the spectral CT information. Further, the method includes performing, with the one or more processing units, guided processing on the second basis image using the first basis image as a guide to provide a modified second basis image. Also, the method includes performing at least one inverse image transform using the first basis image and the modified second basis image to generate at least one modified image.