The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

May. 31, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Fabiano C. Botelho, Sunnyvale, CA (US);

Mark Chamness, Menlo Park, CA (US);

Dmitry Serdyuk, St. Petersburg, RU;

Guilherme Menezes, Santa Clara, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06N 5/022 (2013.01); G06N 5/025 (2013.01);
Abstract

Mechanisms for predicting a GC duration are described herein. In one embodiment, the mechanisms include receiving a first set of features determined based on current operating status and prior garbage collection (GC) statistics of a first storage system. In one embodiment, the mechanisms include predicting a GC duration of a first GC process being performed at the first storage system by applying a predictive model on the first set of features, wherein the predictive model was generated based on a second set of features received periodically from a plurality of storage systems.


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