The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
May. 13, 2015
Huazhong University of Science and Technology, Wuhan, CN;
Tianxu Zhang, Wuhan, CN;
Sufei Fan, Wuhan, CN;
Yimeng Chen, Wuhan, CN;
Yayun Zheng, Wuhan, CN;
Changsheng Chen, Wuhan, CN;
Zheng Wang, Wuhan, CN;
Huan Wu, Wuhan, CN;
Xudong He, Wuhan, CN;
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Wuhan, CN;
Abstract
A method for estimating a rotation axis and a mass center of a spatial target based on binocular optical flows. The method includes: extracting feature points from binocular image sequences sequentially and respectively, and calculating binocular optical flows formed thereby; removing areas ineffective for reconstructing a three-dimensional movement trajectory from the binocular optical flows of the feature points, whereby obtaining effective area-constrained binocular optical flows, and reconstructing a three-dimensional movement trajectory of a spatial target; and removing areas with comparatively large errors in reconstructing three-dimensional motion vectors from the optical flows by multiple iterations, estimating a rotation axis according to a three-dimensional motion vector sequence of each of the feature points obtained thereby, obtaining a spatial equation of an estimated rotation axis by weighted average of estimated results of the feature points, and obtaining spatial coordinates of a mass center of the target according to two estimated rotation axes.