The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Jan. 18, 2012
Applicant:
Kenzaburo Suzuki, Yokohama, JP;
Inventor:
Kenzaburo Suzuki, Yokohama, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 17/08 (2006.01); G02B 27/00 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G02B 5/18 (2013.01); G02B 17/086 (2013.01); G02B 27/0037 (2013.01); G02B 27/4211 (2013.01);
Abstract
A diffraction optical system comprises a free curve surface prism (), and a multilayer diffractive optical element in which a plurality of diffractive element members () are laminated together and a diffractive optical surface (DM) having a grating structure is formed at the interface thereof. The diffraction optical system further satisfies the following conditional expression: 0.005<(ΔNg+ΔNs)/2<0.45, where ΔNg denotes a refractive index difference at g-line on the diffractive optical surface (DM), and ΔNs denotes a refractive index difference at s-line on the diffractive optical surface (DM).