The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

Jul. 10, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventor:

Wai M. Ma, Poughkeepsie, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06755 (2013.01); G01R 1/06738 (2013.01); G01R 31/2808 (2013.01);
Abstract

A test probe is provided for probing signal information on a back-drilled plated through hole connector formed in a printed circuit board, where the test probe includes a conductive probe body with a distal tip region extending a predetermined minimum coverage length (L) that is longer than a recess depth dimension (D) for a recessed plating layer formed in the back-drilled plated through hole connector with an elastomer test probe tip formed around the distal tip region and having a total tip width (W) which is compressed when inserted into the recessed plating layer formed in a back-drilled plated through hole connector, thereby establishing a conductive path between the conductive probe body and the recessed plating layer.


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