The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
Sep. 10, 2014
Anton Paar Gmbh, Graz, AT;
Josef Gautsch, Graz, AT;
Christian Resch, Graz, AT;
Anton Paar GmbH, Graz, AT;
Abstract
A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part () and a second chamber part () which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.