The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2016
Filed:
May. 01, 2013
Applicant:
Datacolor, Inc., Lawrenceville, NJ (US);
Inventor:
Zhiling Xu, Princeton Junction, NJ (US);
Assignee:
DATACOLOR HOLDING AG, Luzern, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/22 (2006.01); G01N 21/55 (2014.01); G01N 21/00 (2006.01); G08B 21/00 (2006.01); G01C 19/00 (2013.01); G01N 21/47 (2006.01); G01N 21/57 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); G01N 21/55 (2013.01); G01N 21/57 (2013.01);
Abstract
An apparatus and method for providing a solution that enables technicians or other technical professionals to obtain accurate gloss, haze and DOI values for a reflecting sample due to the surface conditions of the sample. The apparatus and method allow for the generation of a data model of the surface of a sample using a sensor array designed to detect the divergence of a collimated beam of light reflected off the surface of the sample. The same principle enables technical professionals to obtain accurate haze and clarity values for a transparent or translucent sample that is trans-illuminated by light.