The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9459194 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 04, 2016

Filed:

Jan. 03, 2014
Applicant:

Cardio Metrix, Pleasanton, CA (US);

Inventors:

William Henry Benner, Danville, CA (US);

Donald John Holve, Berkeley, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 15/02 (2006.01); G01N 15/00 (2006.01); G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0266 (2013.01); G01N 2001/2223 (2013.01); G01N 2015/0046 (2013.01); G01N 2015/0053 (2013.01);
Abstract

Apparatuses, methods, and systems are disclosed for analyzing particles from about 0.001 to about 1 μm in diameter by controlling a gaseous medium through which the particles travel so that properties of the particles, such as diameter, electrical mobility, and charge, are measured. One embodiment of the disclosed apparatuses includes a particle source generator, a nozzle, a chamber, an electronic gate, and a detector. Resolution of the measurements made by the disclosed apparatuses is improved by use of a mathematical deconvolution of a spread in arrival times generated by particles of different sizes and charge levels and non-ideal background flow velocity variations.


Find Patent Forward Citations

Benner, William. (2016). Apparatuses, processes, and systems for measuring particle size distribution and concentration (U.S. Patent No. 9459194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9459194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…