The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2016

Filed:

May. 15, 2015
Applicant:

Alcatel-lucent Usa Inc., Murray Hill, NJ (US);

Inventors:

Po Dong, Murray Hill, NJ (US);

Young-Kai Chen, Murray Hill, NJ (US);

Assignee:

Alcatel Lucent, Boulogne, Billancourt, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01); H01L 21/66 (2006.01); G01R 31/3187 (2006.01); G01R 31/28 (2006.01); H01L 33/00 (2010.01); G02B 6/122 (2006.01);
U.S. Cl.
CPC ...
G01M 11/30 (2013.01); G01R 31/282 (2013.01); G01R 31/3187 (2013.01); G02B 6/122 (2013.01); H01L 22/30 (2013.01); H01L 33/005 (2013.01);
Abstract

An apparatus comprising a wafer substrate having a planar optical layer thereon and a plurality of adjacent pairs of sacrificial optical testing parts and optical circuit parts located on the optical layer. The sacrificial testing part includes a vertical optical coupler that is oriented to redirect a test light signal between a direction substantially non-parallel to the planar optical layer and a direction that is substantially parallel to the planar optical layer. The optical circuit part includes an optical edge coupling port oriented to permit transfer of the test light signal through the optical edge coupling port and between the sacrificial testing part and the optical circuit part. The apparatus also comprises a trench located in the planar optical layer, the trench separating the sacrificial testing part from the optical circuit part for each of the plurality of adjacent pairs such that the test light signal passes across the trench between the sacrificial testing part and the optical circuit part.


Find Patent Forward Citations

Loading…